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CAMP March Newsletter: Page4

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Clarkson’s Spinoff Company, NanoScience Solutions, LLC, Awarded SBIR and STTR Grants


Professor Igor Sokolov

NanoScience Solutions (a spinoff company of Clarkson University) has been awarded a small business innovation research (SBIR) grant from the National Science Foundation and a small business technology transfer grant (STTR) from the US Air Force. The work for these projects will be carried out in collaboration with Clarkson University and led by Principal Investigator Professor Igor Sokolov, of the University’s Department of Physics and its Department of Chemistry and Biomolecular Science. Sokolov is also the Director of the University’s Nanoengineering and Biotechnology Laboratories Center (NABLAB).

The grant from the National Science Foundation is for the development of a novel technology that will enable the measuring of mechanical (viscoelastic) properties of soft materials with more than 100 times higher resolution and more than 100 times faster than existing instruments can do. Professor Sokolov is the co-inventor of this patented technology, which is important for the discovery of novel nanocomposite materials and for the development of new diagnostic tools for the medicine of tomorrow. It will add a new dimension to the study of the mechanics of polymers, nanocomposites, biomaterials, cells, and human tissue. In addition, this research will result in the development and production of cutting edge, commercially viable instruments.

The US Air Force grant is for the development of new bright infrared nanoparticles that absorb and emit in the infrared and lack any visible light emissions. This work can be used for a number of military applications.  Also the commercial development of these nanoparticles can be directed toward biomedical applications for in vivo labeling and imaging.

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 CAMP Gifted Two Microscopes


Professor Yongming Liu

CAMP recently acquired two microscopes. One is an atomic force microscope (AFM), an Autoprobe M5 model, manufactured by Thermomicroscopes.  This instrument provides a 3D profile of a sample’s surface on a nanoscale by measuring the forces between a sharp probe (ex. < 10 nm) and the surface at a very short distance (ex. 0.2 – 10 nm probe-sample separation).

The other instrument is a JSM-6330F scanning electron microscope (SEM) that is manufactured by JEOL. It is similar to an existing SEM at CAMP. This particular instrument includes some special options such as a field emission gun for the electron source, airlock for bulk or large diameter sample loading, and automation of the X and Y stage movement via joystick control.