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Facilities

In this Section

Center for Advanced Materials Processing: Instrumentation

Electron Microscopes 

General Instrumentation 


 Electron Microscopes 

  • JEOL 2010 High Resolution Scanning Transmission Electron Microscope

hrtem

  • JEOL 7400 High Resolution Field Emission Electron Microscope

FESEM

  • JEOL JSM 6300 Scanning Electron Microscope

sem

  • JEOL JEM1200 EX Transmission Electron Microscope

 tem


General Instrumentation 

  • Malvern 2000 Laser Diffraction Particle Size Analyzer

malpsd

  • ALV Simultaneous Static and Dynamic Light Scattering Analyzer

Time-resolved simultaneous static and dynamic light scattering instrument

 alv

  • Thermal Gravimetric Analyzer TGA 7 Perkin Elmer

 tga

  • Bruker D8 X-Ray Diffractometer

xrd